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Atom chips on direct bonded copper substrates

  • Matthew B. Squires
  • , James A. Stickney
  • , Evan J. Carlson
  • , Paul M. Baker
  • , Walter R. Buchwald
  • , Sandra Wentzell
  • , Steven M. Miller
  • Air Force Research Laboratory

Research output: Contribution to journalArticlepeer-review

Abstract

We present the use of direct bonded copper (DBC) for the straightforward fabrication of high power atom chips. Atom chips using DBC have several benefits: excellent copper/substrate adhesion, high purity, thick (>100 μm) copper layers, high substrate thermal conductivity, high aspect ratio wires, the potential for rapid (<8 h) fabrication, and three-dimensional atom chip structures. Two mask options for DBC atom chip fabrication are presented, as well as two methods for etching wire patterns into the copper layer. A test chip, able to support 100 A of current for 2 s without failing, is used to determine the thermal impedance of the DBC. An assembly using two DBC atom chips is used to magnetically trap laser cooled 87Rb atoms. The wire aspect ratio that optimizes the magnetic field gradient as a function of power dissipation is determined to be 0.84:1 (height:width).

Original languageEnglish
Article number023101
JournalReview of Scientific Instruments
Volume82
Issue number2
DOIs
StatePublished - Feb 2011

ASJC Scopus Subject Areas

  • Instrumentation

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