Comparator-based measurement scheme for dark-count rates in single photon avalanche diodes

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)2020-2026
Number of pages7
JournalIEEE Transactions on Instrumentation and Measurement
Volume54
Issue number5
DOIs
StatePublished - Oct 2005

ASJC Scopus Subject Areas

  • Instrumentation
  • Electrical and Electronic Engineering

Keywords

  • Dark count rate
  • Geiger-mode
  • Photon counting
  • Single photon avalanche detector (SPADs)

Fingerprint

Dive into the research topics of 'Comparator-based measurement scheme for dark-count rates in single photon avalanche diodes'. Together they form a unique fingerprint.

Cite this