Dry etch induced defects and H passivation of GaAs surfaces produced by Ch4/H2/Ar plasmas

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)221-225
Number of pages5
JournalMaterials Research Society Symposium - Proceedings
Volume340
DOIs
StatePublished - 1994
EventProceedings of the MRS Symposium - San Francisco, CA, USA
Duration: Apr 4 1994Apr 7 1994

ASJC Scopus Subject Areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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