Effects of deep defect concentration on junction space charge capacitance measurements

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@article{eee2f60b336844d69f99a5e07b9354c4,

title = "Effects of deep defect concentration on junction space charge capacitance measurements",

author = "Buchwald, \{Walter R.\} and Morath, \{Christian P.\} and Drevinsky, \{Peter J.\}",

year = "2007",

doi = "10.1063/1.2719291",

language = "English",

volume = "101",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "9",

}

TY - JOUR

T1 - Effects of deep defect concentration on junction space charge capacitance measurements

AU - Buchwald, Walter R.

AU - Morath, Christian P.

AU - Drevinsky, Peter J.

PY - 2007

Y1 - 2007

UR - https://www.scopus.com/pages/publications/34248523569

UR - https://www.scopus.com/pages/publications/34248523569#tab=citedBy

U2 - 10.1063/1.2719291

DO - 10.1063/1.2719291

M3 - Article

AN - SCOPUS:34248523569

SN - 0021-8979

VL - 101

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9

M1 - 094503

ER -