Skip to main navigation Skip to search Skip to main content

Evaluation of VIIIRS daily BRDF, Albedo, and NBAR product using the MODIS Collection V006 product and in situ measurements

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2016 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1962-1965
Number of pages4
ISBN (Electronic)9781509033324
DOIs
StatePublished - Nov 1 2016
Event36th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2016 - Beijing, China
Duration: Jul 10 2016Jul 15 2016

Publication series

NameInternational Geoscience and Remote Sensing Symposium (IGARSS)
Volume2016-November

Conference

Conference36th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2016
Country/TerritoryChina
CityBeijing
Period7/10/167/15/16

ASJC Scopus Subject Areas

  • Computer Science Applications
  • General Earth and Planetary Sciences

Keywords

  • Albedo
  • BRDF
  • Evaluation
  • MODIS
  • NBAR
  • VIIRS

Fingerprint

Dive into the research topics of 'Evaluation of VIIIRS daily BRDF, Albedo, and NBAR product using the MODIS Collection V006 product and in situ measurements'. Together they form a unique fingerprint.

Cite this