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Fabrication and characteristics of GaN/AlGaN multilayer structure for terahertz quantum-cascade laser

  • National Yang Ming Chiao Tung University
  • Air Force Research Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The GaN/AlGaN multilayer structure for the active regions of terahertz quantum cascade lasers (QCLs) was grown by metal organic chemical vapor deposition (MOCVD). The surface morphology of the grown sample showed good surface quality with an average roughness of less than 1 nm. The x-ray diffraction pattern and transmission electron microscopy images showed that the well-controlled quantum cascade GaN/AlGaN layers were grown. The Fourier transform infrared spectrometer measurement showed a distinct A1 (LO) phonon frequency at 822 cm-1 that is redshifted with respect to the single Al0.2Ga0.8N layer due to the good periodicity of the grown quantum cascade GaN/Al0.2Ga0.8N structure. MOCVD growth should be a viable technique for fabrication of AlGaN/GaN quantum cascade laser and phonon frequency shift should be a key indicator for the good periodicity of the grown QCL structure.

Original languageEnglish
Title of host publicationTerahertz Physics, Devices, and Systems
DOIs
StatePublished - 2006
EventTerahertz Physics, Devices, and Systems - Boston, MA, United States
Duration: Oct 2 2006Oct 4 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6373
ISSN (Print)0277-786X

Conference

ConferenceTerahertz Physics, Devices, and Systems
Country/TerritoryUnited States
CityBoston, MA
Period10/2/0610/4/06

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • AlGaN
  • MOCVD
  • Quantum cascade laser
  • TEM
  • XRD

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