Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS

Crystal Schaaf; Alan Strahler; Feng Gao; Wolfgang Lucht; Yufang Jin; Xiaowen Li; Xiaoyang Zhang; Elena Tsvetsinskaya; Jan Peter Muller; Phillip Lewis; Michael Barnsley; Gareth Roberts; Christopher Doll; Shunlin Liang; David Roy; Jeffrey Privette

Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS

Crystal Schaaf
, Alan Strahler
, Feng Gao
, Wolfgang Lucht
, Yufang Jin
, Xiaowen Li
, Xiaoyang Zhang
, Elena Tsvetsinskaya
, Jan Peter Muller
, Phillip Lewis
, Michael Barnsley
, Gareth Roberts
, Christopher Doll
, Shunlin Liang
, David Roy
, Jeffrey Privette

SFE - Dean's Office

Boston University

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	1188-1190
Number of pages	3
State	Published - 2002
Event	2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002) - Toronto, Ont., Canada Duration: Jun 24 2002 → Jun 28 2002

Conference

Conference	2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002)
Country/Territory	Canada
City	Toronto, Ont.
Period	6/24/02 → 6/28/02

ASJC Scopus Subject Areas

Computer Science Applications
General Earth and Planetary Sciences

Cite this

Schaaf, C., Strahler, A., Gao, F., Lucht, W., Jin, Y., Li, X., Zhang, X., Tsvetsinskaya, E., Muller, J. P., Lewis, P., Barnsley, M., Roberts, G., Doll, C., Liang, S., Roy, D., & Privette, J. (2002). Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS. 1188-1190. Paper presented at 2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002), Toronto, Ont., Canada.

Schaaf, C, Strahler, A, Gao, F, Lucht, W, Jin, Y, Li, X, Zhang, X, Tsvetsinskaya, E, Muller, JP, Lewis, P, Barnsley, M, Roberts, G, Doll, C, Liang, S, Roy, D & Privette, J 2002, 'Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS', Paper presented at 2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002), Toronto, Ont., Canada, 6/24/02 - 6/28/02 pp. 1188-1190.

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title = "Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS",

author = "Crystal Schaaf and Alan Strahler and Feng Gao and Wolfgang Lucht and Yufang Jin and Xiaowen Li and Xiaoyang Zhang and Elena Tsvetsinskaya and Muller, \{Jan Peter\} and Phillip Lewis and Michael Barnsley and Gareth Roberts and Christopher Doll and Shunlin Liang and David Roy and Jeffrey Privette",

year = "2002",

language = "English",

pages = "1188--1190",

note = "2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002) ; Conference date: 24-06-2002 Through 28-06-2002",

}

TY - CONF

T1 - Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS

AU - Schaaf, Crystal

AU - Strahler, Alan

AU - Gao, Feng

AU - Lucht, Wolfgang

AU - Jin, Yufang

AU - Li, Xiaowen

AU - Zhang, Xiaoyang

AU - Tsvetsinskaya, Elena

AU - Muller, Jan Peter

AU - Lewis, Phillip

AU - Barnsley, Michael

AU - Roberts, Gareth

AU - Doll, Christopher

AU - Liang, Shunlin

AU - Roy, David

AU - Privette, Jeffrey

PY - 2002

Y1 - 2002

UR - https://www.scopus.com/pages/publications/0036031444

UR - https://www.scopus.com/pages/publications/0036031444#tab=citedBy

M3 - Paper

AN - SCOPUS:0036031444

SP - 1188

EP - 1190

T2 - 2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002)

Y2 - 24 June 2002 through 28 June 2002

ER -

Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS

Conference

ASJC Scopus Subject Areas

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