Investigation on the formation and propagation of defects in GeSn thin films

A. Mosleh; M. Benamara; S. A. Ghetmiri; B. Conely; M. Alher; W. Du; G. Sun; R. Soref; J. Margetis; J. Tolle; S. Q. Yu; H. Naseem

doi:10.1149/06406.0895ecst

Investigation on the formation and propagation of defects in GeSn thin films

A. Mosleh
, M. Benamara
, S. A. Ghetmiri
, B. Conely
, M. Alher
, W. Du
, G. Sun
, R. Soref
, J. Margetis
, J. Tolle
, S. Q. Yu
, H. Naseem

Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	895-901
Number of pages	7
Journal	ECS Transactions
Volume	64
Issue number	6
DOIs	https://doi.org/10.1149/06406.0895ecst
State	Published - 2014
Event	6th SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 2014 ECS and SMEQ Joint International Meeting - Cancun, Mexico Duration: Oct 5 2014 → Oct 9 2014

ASJC Scopus Subject Areas

General Engineering

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10.1149/06406.0895ecst

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@article{7370c3d7f2c341b883fee5decf3b4b8b,

title = "Investigation on the formation and propagation of defects in GeSn thin films",

author = "A. Mosleh and M. Benamara and Ghetmiri, \{S. A.\} and B. Conely and M. Alher and W. Du and G. Sun and R. Soref and J. Margetis and J. Tolle and Yu, \{S. Q.\} and H. Naseem",

note = "Publisher Copyright: {\textcopyright} The Electrochemical Society.; 6th SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 2014 ECS and SMEQ Joint International Meeting ; Conference date: 05-10-2014 Through 09-10-2014",

year = "2014",

doi = "10.1149/06406.0895ecst",

language = "English",

volume = "64",

pages = "895--901",

journal = "ECS Transactions",

issn = "1938-5862",

number = "6",

}

TY - JOUR

T1 - Investigation on the formation and propagation of defects in GeSn thin films

AU - Mosleh, A.

AU - Benamara, M.

AU - Ghetmiri, S. A.

AU - Conely, B.

AU - Alher, M.

AU - Du, W.

AU - Sun, G.

AU - Soref, R.

AU - Margetis, J.

AU - Tolle, J.

AU - Yu, S. Q.

AU - Naseem, H.

PY - 2014

Y1 - 2014

UR - https://www.scopus.com/pages/publications/84921322393

UR - https://www.scopus.com/pages/publications/84921322393#tab=citedBy

U2 - 10.1149/06406.0895ecst

DO - 10.1149/06406.0895ecst

M3 - Conference article

AN - SCOPUS:84921322393

SN - 1938-5862

VL - 64

SP - 895

EP - 901

JO - ECS Transactions

JF - ECS Transactions

IS - 6

T2 - 6th SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 2014 ECS and SMEQ Joint International Meeting

Y2 - 5 October 2014 through 9 October 2014

ER -

Investigation on the formation and propagation of defects in GeSn thin films

ASJC Scopus Subject Areas

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