Open Source Interface for 2D and 3D Analysis: Bridging the Gap between Experimentalists and Image Specialists

Jeffrey La; Briana Mason; Tiffany Donaldson; Chandra Yelleswarapu

Open Source Interface for 2D and 3D Analysis: Bridging the Gap between Experimentalists and Image Specialists

Jeffrey La
, Briana Mason
, Tiffany Donaldson
, Chandra Yelleswarapu

University of Massachusetts Boston

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Applied Industrial Optics
Subtitle of host publication	Spectroscopy, Imaging and Metrology, AIO 2017
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Electronic)	9781943580293
State	Published - 2017
Event	Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017 - San Francisco, United States Duration: Jun 26 2017 → Jun 29 2017

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017
Country/Territory	United States
City	San Francisco
Period	6/26/17 → 6/29/17

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Cite this

Open Source Interface for 2D and 3D Analysis: Bridging the Gap between Experimentalists and Image Specialists. / La, Jeffrey; Mason, Briana; Donaldson, Tiffany et al.
Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017. Optica Publishing Group (formerly OSA), 2017. JTu5A.22 (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

La, J, Mason, B, Donaldson, T & Yelleswarapu, C 2017, Open Source Interface for 2D and 3D Analysis: Bridging the Gap between Experimentalists and Image Specialists. in Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017., JTu5A.22, Optics InfoBase Conference Papers, Optica Publishing Group (formerly OSA), Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017, San Francisco, United States, 6/26/17.

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title = "Open Source Interface for 2D and 3D Analysis: Bridging the Gap between Experimentalists and Image Specialists",

author = "Jeffrey La and Briana Mason and Tiffany Donaldson and Chandra Yelleswarapu",

note = "Publisher Copyright: {\textcopyright} 2017 Optical Society of America.; Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017 ; Conference date: 26-06-2017 Through 29-06-2017",

year = "2017",

language = "English",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Applied Industrial Optics",

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T1 - Open Source Interface for 2D and 3D Analysis

T2 - Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017

AU - La, Jeffrey

AU - Mason, Briana

AU - Donaldson, Tiffany

AU - Yelleswarapu, Chandra

PY - 2017

Y1 - 2017

UR - https://www.scopus.com/pages/publications/85136365931

UR - https://www.scopus.com/pages/publications/85136365931#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:85136365931

T3 - Optics InfoBase Conference Papers

BT - Applied Industrial Optics

PB - Optica Publishing Group (formerly OSA)

Y2 - 26 June 2017 through 29 June 2017

ER -

Open Source Interface for 2D and 3D Analysis: Bridging the Gap between Experimentalists and Image Specialists

Publication series

Conference

ASJC Scopus Subject Areas

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Cite this