Optical Characterization of Si-Based Ge1−xSn x Alloys  with Sn Compositions up to 12%

Sattar Al-Kabi; Seyed Amir Ghetmiri; Joe Margetis; Wei Du; Aboozar Mosleh; Murtadha Alher; Wei Dou; Joshua M. Grant; Greg Sun; Richard A. Soref; John Tolle; Baohua Li; Mansour Mortazavi; Hameed A. Naseem; Shui Qing Yu

doi:10.1007/s11664-015-4283-6

Optical Characterization of Si-Based Ge_1−xSn_x Alloys with Sn Compositions up to 12%

Sattar Al-Kabi
, Seyed Amir Ghetmiri
, Joe Margetis
, Wei Du
, Aboozar Mosleh
, Murtadha Alher
, Wei Dou
, Joshua M. Grant
, Greg Sun
, Richard A. Soref
, John Tolle
, Baohua Li
, Mansour Mortazavi
, Hameed A. Naseem
, Shui Qing Yu

Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2133-2141
Number of pages	9
Journal	Journal of Electronic Materials
Volume	45
Issue number	4
DOIs	https://doi.org/10.1007/s11664-015-4283-6
State	Published - Apr 1 2016

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Keywords

GeSn alloy
n- doped GeSn
photoluminescence
Raman spectroscopy

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10.1007/s11664-015-4283-6

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Al-Kabi, S., Ghetmiri, S. A., Margetis, J., Du, W., Mosleh, A., Alher, M., Dou, W., Grant, J. M., Sun, G., Soref, R. A., Tolle, J., Li, B., Mortazavi, M., Naseem, H. A., & Yu, S. Q. (2016). Optical Characterization of Si-Based Ge_1−xSn_x Alloys with Sn Compositions up to 12%. Journal of Electronic Materials, 45(4), 2133-2141. https://doi.org/10.1007/s11664-015-4283-6

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title = "Optical Characterization of Si-Based Ge1−xSn x Alloys with Sn Compositions up to 12\%",

keywords = "GeSn alloy, n- doped GeSn, photoluminescence, Raman spectroscopy",

author = "Sattar Al-Kabi and Ghetmiri, \{Seyed Amir\} and Joe Margetis and Wei Du and Aboozar Mosleh and Murtadha Alher and Wei Dou and Grant, \{Joshua M.\} and Greg Sun and Soref, \{Richard A.\} and John Tolle and Baohua Li and Mansour Mortazavi and Naseem, \{Hameed A.\} and Yu, \{Shui Qing\}",

note = "Publisher Copyright: {\textcopyright} 2015, The Minerals, Metals \& Materials Society.",

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doi = "10.1007/s11664-015-4283-6",

language = "English",

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T1 - Optical Characterization of Si-Based Ge1−xSn x Alloys with Sn Compositions up to 12%

AU - Al-Kabi, Sattar

AU - Ghetmiri, Seyed Amir

AU - Margetis, Joe

AU - Du, Wei

AU - Mosleh, Aboozar

AU - Alher, Murtadha

AU - Dou, Wei

AU - Grant, Joshua M.

AU - Sun, Greg

AU - Soref, Richard A.

AU - Tolle, John

AU - Li, Baohua

AU - Mortazavi, Mansour

AU - Naseem, Hameed A.

AU - Yu, Shui Qing

PY - 2016/4/1

Y1 - 2016/4/1

KW - GeSn alloy

KW - n- doped GeSn

KW - photoluminescence

KW - Raman spectroscopy

UR - https://www.scopus.com/pages/publications/84961150633

UR - https://www.scopus.com/pages/publications/84961150633#tab=citedBy

U2 - 10.1007/s11664-015-4283-6

DO - 10.1007/s11664-015-4283-6

M3 - Article

AN - SCOPUS:84961150633

SN - 0361-5235

VL - 45

SP - 2133

EP - 2141

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 4

ER -

Optical Characterization of Si-Based Ge_1−xSn_x Alloys with Sn Compositions up to 12%

ASJC Scopus Subject Areas

Keywords

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