Optical Characterization of Si-Based Ge1−xSn x Alloys  with Sn Compositions up to 12%

Sattar Al-Kabi; Seyed Amir Ghetmiri; Joe Margetis; Wei Du; Aboozar Mosleh; Murtadha Alher; Wei Dou; Joshua M. Grant; Greg Sun; Richard A. Soref; John Tolle; Baohua Li; Mansour Mortazavi; Hameed A. Naseem; Shui Qing Yu

doi:10.1007/s11664-015-4283-6

Optical Characterization of Si-Based Ge_1−xSn_x Alloys with Sn Compositions up to 12%

Sattar Al-Kabi
, Seyed Amir Ghetmiri
, Joe Margetis
, Wei Du
, Aboozar Mosleh
, Murtadha Alher
, Wei Dou
, Joshua M. Grant
, Greg Sun
, Richard A. Soref
, John Tolle
, Baohua Li
, Mansour Mortazavi
, Hameed A. Naseem
, Shui Qing Yu

Engineering

University of Arkansas
University of Arkansas System
Wasit University
ASM
University of Kerbala
University of Massachusetts Boston
Arktonics, LLC
University of Arkansas at Pine Bluff

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2133-2141
Number of pages	9
Journal	Journal of Electronic Materials
Volume	45
Issue number	4
DOIs	https://doi.org/10.1007/s11664-015-4283-6
State	Published - Apr 1 2016

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Keywords

GeSn alloy
n- doped GeSn
photoluminescence
Raman spectroscopy

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10.1007/s11664-015-4283-6

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Al-Kabi, S., Ghetmiri, S. A., Margetis, J., Du, W., Mosleh, A., Alher, M., Dou, W., Grant, J. M., Sun, G., Soref, R. A., Tolle, J., Li, B., Mortazavi, M., Naseem, H. A., & Yu, S. Q. (2016). Optical Characterization of Si-Based Ge_1−xSn_x Alloys with Sn Compositions up to 12%. Journal of Electronic Materials, 45(4), 2133-2141. https://doi.org/10.1007/s11664-015-4283-6

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title = "Optical Characterization of Si-Based Ge1−xSn x Alloys with Sn Compositions up to 12\%",

keywords = "GeSn alloy, n- doped GeSn, photoluminescence, Raman spectroscopy",

author = "Sattar Al-Kabi and Ghetmiri, \{Seyed Amir\} and Joe Margetis and Wei Du and Aboozar Mosleh and Murtadha Alher and Wei Dou and Grant, \{Joshua M.\} and Greg Sun and Soref, \{Richard A.\} and John Tolle and Baohua Li and Mansour Mortazavi and Naseem, \{Hameed A.\} and Yu, \{Shui Qing\}",

note = "Publisher Copyright: {\textcopyright} 2015, The Minerals, Metals \& Materials Society.",

year = "2016",

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day = "1",

doi = "10.1007/s11664-015-4283-6",

language = "English",

volume = "45",

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T1 - Optical Characterization of Si-Based Ge1−xSn x Alloys with Sn Compositions up to 12%

AU - Al-Kabi, Sattar

AU - Ghetmiri, Seyed Amir

AU - Margetis, Joe

AU - Du, Wei

AU - Mosleh, Aboozar

AU - Alher, Murtadha

AU - Dou, Wei

AU - Grant, Joshua M.

AU - Sun, Greg

AU - Soref, Richard A.

AU - Tolle, John

AU - Li, Baohua

AU - Mortazavi, Mansour

AU - Naseem, Hameed A.

AU - Yu, Shui Qing

PY - 2016/4/1

Y1 - 2016/4/1

KW - GeSn alloy

KW - n- doped GeSn

KW - photoluminescence

KW - Raman spectroscopy

UR - https://www.scopus.com/pages/publications/84961150633

UR - https://www.scopus.com/pages/publications/84961150633#tab=citedBy

U2 - 10.1007/s11664-015-4283-6

DO - 10.1007/s11664-015-4283-6

M3 - Article

AN - SCOPUS:84961150633

SN - 0361-5235

VL - 45

SP - 2133

EP - 2141

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 4

ER -

Optical Characterization of Si-Based Ge_1−xSn_x Alloys with Sn Compositions up to 12%

ASJC Scopus Subject Areas

Keywords

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