TY - GEN
T1 - Photoacoustic Z-scan for the measurement of third-order nonlinear absorption coefficient
AU - Yelleswarapu, Chandra S.
AU - Sri-Rajasekharkothapalli,
AU - Rao, D. V.G.L.N.
PY - 2011
Y1 - 2011
N2 - The third order optical nonlinearities cover a vast and diverse area in nonlinear optics. The third order nonlinear susceptibility χ(3) is a complex quantity and its real and imaginary components represent nonlinear refraction and nonlinear absorption, respectively. Measurement of these parameters is important for many practical applications. Z-scan is a simple optical technique for determining these characteristics with high accuracy. Here we present a novel photoacoustic Z-scan (PAZ-scan) technique that combines the advantages offered by the conventional Z-scan method and the sensitivity of the photoacoustic detection. In PAZ-scan, instead of measuring the transmitted optical signal as in the case of traditional Z-scan, we record the generated photoacoustic (PA) signal using a 10 MHz focused ultrasound transducer while the sample is translated along the focused laser beam. Since the photoacoustic signal strength is directly proportional to the optical absorption, PAZ-scan displays nonlinear behavior depicting the nonlinear optical absorption of the material. For reverse saturable absorber (RSA) materials, absorption and hence the PA signal increases with the increase of input intensity. Similarly for saturable absorber (SA) materials, absorption and the associated PA signal decreases with increase in input intensity. We studied the nonlinear absorption properties of SA and RSA materials. Our calculations of nonlinear absorption coefficient are in good agreement with conventional the Z-scan data.We believe that PAZ-scan will be a valuable tool for material characterization and has potential for applications in the fields of chemistry, physics, material science, biomedical, and manufacturing.
AB - The third order optical nonlinearities cover a vast and diverse area in nonlinear optics. The third order nonlinear susceptibility χ(3) is a complex quantity and its real and imaginary components represent nonlinear refraction and nonlinear absorption, respectively. Measurement of these parameters is important for many practical applications. Z-scan is a simple optical technique for determining these characteristics with high accuracy. Here we present a novel photoacoustic Z-scan (PAZ-scan) technique that combines the advantages offered by the conventional Z-scan method and the sensitivity of the photoacoustic detection. In PAZ-scan, instead of measuring the transmitted optical signal as in the case of traditional Z-scan, we record the generated photoacoustic (PA) signal using a 10 MHz focused ultrasound transducer while the sample is translated along the focused laser beam. Since the photoacoustic signal strength is directly proportional to the optical absorption, PAZ-scan displays nonlinear behavior depicting the nonlinear optical absorption of the material. For reverse saturable absorber (RSA) materials, absorption and hence the PA signal increases with the increase of input intensity. Similarly for saturable absorber (SA) materials, absorption and the associated PA signal decreases with increase in input intensity. We studied the nonlinear absorption properties of SA and RSA materials. Our calculations of nonlinear absorption coefficient are in good agreement with conventional the Z-scan data.We believe that PAZ-scan will be a valuable tool for material characterization and has potential for applications in the fields of chemistry, physics, material science, biomedical, and manufacturing.
KW - Nonlinear absorption
KW - Photoacousitcs
KW - Third-order nonlinear optical characterization
KW - Z-scan
UR - https://www.scopus.com/pages/publications/79954622978
UR - https://www.scopus.com/pages/publications/79954622978#tab=citedBy
U2 - 10.1117/12.875470
DO - 10.1117/12.875470
M3 - Conference contribution
AN - SCOPUS:79954622978
SN - 9780819484543
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Nonlinear Frequency Generation and Conversion
T2 - Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications X
Y2 - 24 January 2011 through 27 January 2011
ER -