Stability of pseudomorphic and compressively strained Ge1-xSnx thin films under rapid thermal annealing

B. R. Conley; A. Mosleh; S. A. Ghetmiri; W. Du; G. Sun; R. Soref; J. Margetis; J. Tolle; H. A. Naseem; S. Q. Yu

doi:10.1149/06406.0881ecst

Stability of pseudomorphic and compressively strained Ge1-xSnx thin films under rapid thermal annealing

B. R. Conley
, A. Mosleh
, S. A. Ghetmiri
, W. Du
, G. Sun
, R. Soref
, J. Margetis
, J. Tolle
, H. A. Naseem
, S. Q. Yu

Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	881-893
Number of pages	13
Journal	ECS Transactions
Volume	64
Issue number	6
DOIs	https://doi.org/10.1149/06406.0881ecst
State	Published - 2014
Event	6th SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 2014 ECS and SMEQ Joint International Meeting - Cancun, Mexico Duration: Oct 5 2014 → Oct 9 2014

ASJC Scopus Subject Areas

General Engineering

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10.1149/06406.0881ecst

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@article{e363aae10f6c484f9ce349dcfb73a171,

title = "Stability of pseudomorphic and compressively strained Ge1-xSnx thin films under rapid thermal annealing",

author = "Conley, \{B. R.\} and A. Mosleh and Ghetmiri, \{S. A.\} and W. Du and G. Sun and R. Soref and J. Margetis and J. Tolle and Naseem, \{H. A.\} and Yu, \{S. Q.\}",

note = "Publisher Copyright: {\textcopyright} The Electrochemical Society.; 6th SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 2014 ECS and SMEQ Joint International Meeting ; Conference date: 05-10-2014 Through 09-10-2014",

year = "2014",

doi = "10.1149/06406.0881ecst",

language = "English",

volume = "64",

pages = "881--893",

journal = "ECS Transactions",

issn = "1938-5862",

number = "6",

}

TY - JOUR

T1 - Stability of pseudomorphic and compressively strained Ge1-xSnx thin films under rapid thermal annealing

AU - Conley, B. R.

AU - Mosleh, A.

AU - Ghetmiri, S. A.

AU - Du, W.

AU - Sun, G.

AU - Soref, R.

AU - Margetis, J.

AU - Tolle, J.

AU - Naseem, H. A.

AU - Yu, S. Q.

N1 - Publisher Copyright: © The Electrochemical Society.

PY - 2014

Y1 - 2014

UR - https://www.scopus.com/pages/publications/84921279807

UR - https://www.scopus.com/pages/publications/84921279807#tab=citedBy

U2 - 10.1149/06406.0881ecst

DO - 10.1149/06406.0881ecst

M3 - Conference article

AN - SCOPUS:84921279807

SN - 1938-5862

VL - 64

SP - 881

EP - 893

JO - ECS Transactions

JF - ECS Transactions

IS - 6

T2 - 6th SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 2014 ECS and SMEQ Joint International Meeting

Y2 - 5 October 2014 through 9 October 2014

ER -

Stability of pseudomorphic and compressively strained Ge1-xSnx thin films under rapid thermal annealing

ASJC Scopus Subject Areas

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