Systematic study of Ge1-xSnx absorption coefficient and refractive index for the device applications of Si-based optoelectronics

Huong Tran; Wei Du; Seyed A. Ghetmiri; Aboozar Mosleh; Greg Sun; Richard A. Soref; Joe Margetis; John Tolle; Baohua Li; Hameed A. Naseem; Shui Qing Yu

doi:10.1063/1.4943652

Systematic study of Ge_1-xSn_x absorption coefficient and refractive index for the device applications of Si-based optoelectronics

Huong Tran
, Wei Du
, Seyed A. Ghetmiri
, Aboozar Mosleh
, Greg Sun
, Richard A. Soref
, Joe Margetis
, John Tolle
, Baohua Li
, Hameed A. Naseem
, Shui Qing Yu

Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	103106
Journal	Journal of Applied Physics
Volume	119
Issue number	10
DOIs	https://doi.org/10.1063/1.4943652
State	Published - Mar 14 2016

ASJC Scopus Subject Areas

General Physics and Astronomy

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10.1063/1.4943652

Cite this

@article{e7fdcd8367254ae8ae141270930724e2,

title = "Systematic study of Ge1-xSnx absorption coefficient and refractive index for the device applications of Si-based optoelectronics",

author = "Huong Tran and Wei Du and Ghetmiri, \{Seyed A.\} and Aboozar Mosleh and Greg Sun and Soref, \{Richard A.\} and Joe Margetis and John Tolle and Baohua Li and Naseem, \{Hameed A.\} and Yu, \{Shui Qing\}",

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year = "2016",

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day = "14",

doi = "10.1063/1.4943652",

language = "English",

volume = "119",

journal = "Journal of Applied Physics",

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publisher = "American Institute of Physics",

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TY - JOUR

T1 - Systematic study of Ge1-xSnx absorption coefficient and refractive index for the device applications of Si-based optoelectronics

AU - Tran, Huong

AU - Du, Wei

AU - Ghetmiri, Seyed A.

AU - Mosleh, Aboozar

AU - Sun, Greg

AU - Soref, Richard A.

AU - Margetis, Joe

AU - Tolle, John

AU - Li, Baohua

AU - Naseem, Hameed A.

AU - Yu, Shui Qing

PY - 2016/3/14

Y1 - 2016/3/14

UR - https://www.scopus.com/pages/publications/84962564686

UR - https://www.scopus.com/pages/publications/84962564686#tab=citedBy

U2 - 10.1063/1.4943652

DO - 10.1063/1.4943652

M3 - Article

AN - SCOPUS:84962564686

SN - 0021-8979

VL - 119

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

M1 - 103106

ER -

Systematic study of Ge_1-xSn_x absorption coefficient and refractive index for the device applications of Si-based optoelectronics

ASJC Scopus Subject Areas

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