Systematic study of Si-based Ge/Ge0.9Sn0.1/Ge photodiodes with 2.6 μm detector cutoff

Thach Pham; Wei Du; Huong Tran; Joe Margetis; John Tolle; Greg Sun; Richard A. Soref; Hameed A. Naseem; Baohua Li; Mansour Mortazavi; Shui Qing Yu

doi:10.1364/cleo_si.2016.sth1g.7

Systematic study of Si-based Ge/Ge_0.9Sn_0.1/Ge photodiodes with 2.6 μm detector cutoff

Thach Pham
, Wei Du
, Huong Tran
, Joe Margetis
, John Tolle
, Greg Sun
, Richard A. Soref
, Hameed A. Naseem
, Baohua Li
, Mansour Mortazavi
, Shui Qing Yu

Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2016 Conference on Lasers and Electro-Optics, CLEO 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781943580118
DOIs	https://doi.org/10.1364/cleo_si.2016.sth1g.7
State	Published - Dec 16 2016
Event	2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States Duration: Jun 5 2016 → Jun 10 2016

Publication series

Name	2016 Conference on Lasers and Electro-Optics, CLEO 2016

Conference

Conference	2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/Territory	United States
City	San Jose
Period	6/5/16 → 6/10/16

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1364/cleo_si.2016.sth1g.7

Cite this

Pham, T., Du, W., Tran, H., Margetis, J., Tolle, J., Sun, G., Soref, R. A., Naseem, H. A., Li, B., Mortazavi, M., & Yu, S. Q. (2016). Systematic study of Si-based Ge/Ge_0.9Sn_0.1/Ge photodiodes with 2.6 μm detector cutoff. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 Article 7788829 (2016 Conference on Lasers and Electro-Optics, CLEO 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/cleo_si.2016.sth1g.7

Systematic study of Si-based Ge/Ge_0.9Sn_0.1/Ge photodiodes with 2.6 μm detector cutoff. / Pham, Thach; Du, Wei; Tran, Huong et al.
2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7788829 (2016 Conference on Lasers and Electro-Optics, CLEO 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Pham, T, Du, W, Tran, H, Margetis, J, Tolle, J, Sun, G, Soref, RA, Naseem, HA, Li, B, Mortazavi, M & Yu, SQ 2016, Systematic study of Si-based Ge/Ge_0.9Sn_0.1/Ge photodiodes with 2.6 μm detector cutoff. in 2016 Conference on Lasers and Electro-Optics, CLEO 2016., 7788829, 2016 Conference on Lasers and Electro-Optics, CLEO 2016, Institute of Electrical and Electronics Engineers Inc., 2016 Conference on Lasers and Electro-Optics, CLEO 2016, San Jose, United States, 6/5/16. https://doi.org/10.1364/cleo_si.2016.sth1g.7

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title = "Systematic study of Si-based Ge/Ge0.9Sn0.1/Ge photodiodes with 2.6 μm detector cutoff",

author = "Thach Pham and Wei Du and Huong Tran and Joe Margetis and John Tolle and Greg Sun and Soref, \{Richard A.\} and Naseem, \{Hameed A.\} and Baohua Li and Mansour Mortazavi and Yu, \{Shui Qing\}",

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AU - Tolle, John

AU - Sun, Greg

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AU - Naseem, Hameed A.

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