The strain dependence of Ge1 - xsnx (x = 0.083) Raman shift

Chiao Chang; Hui Li; Tsung Pin Chen; Wei Kai Tseng; Henry Cheng; Chung Ting Ko; Chung Yen Hsieh; Miin Jang Chen; Greg Sun

doi:10.1016/j.tsf.2015.09.040

The strain dependence of Ge_{1 - x}sn_x (x = 0.083) Raman shift

Chiao Chang
, Hui Li
, Tsung Pin Chen
, Wei Kai Tseng
, Henry Cheng
, Chung Ting Ko
, Chung Yen Hsieh
, Miin Jang Chen
, Greg Sun

Engineering

National Taiwan University

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	40-43
Number of pages	4
Journal	Thin Solid Films
Volume	593
DOIs	https://doi.org/10.1016/j.tsf.2015.09.040
State	Published - Oct 30 2015

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Keywords

Germanium-tin
Molecular beam epitaxy
Raman spectroscopy
Strain
Transmission electron microscopy
X-ray diffraction

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10.1016/j.tsf.2015.09.040

Cite this

@article{90cae5e0d4704fe7a1befd31342a043b,

title = "The strain dependence of Ge1 - xsnx (x = 0.083) Raman shift",

keywords = "Germanium-tin, Molecular beam epitaxy, Raman spectroscopy, Strain, Transmission electron microscopy, X-ray diffraction",

author = "Chiao Chang and Hui Li and Chen, \{Tsung Pin\} and Tseng, \{Wei Kai\} and Henry Cheng and Ko, \{Chung Ting\} and Hsieh, \{Chung Yen\} and Chen, \{Miin Jang\} and Greg Sun",

note = "Publisher Copyright: {\textcopyright} 2015 Elsevier B.V.",

year = "2015",

month = oct,

day = "30",

doi = "10.1016/j.tsf.2015.09.040",

language = "English",

volume = "593",

pages = "40--43",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - The strain dependence of Ge1 - xsnx (x = 0.083) Raman shift

AU - Chang, Chiao

AU - Li, Hui

AU - Chen, Tsung Pin

AU - Tseng, Wei Kai

AU - Cheng, Henry

AU - Ko, Chung Ting

AU - Hsieh, Chung Yen

AU - Chen, Miin Jang

AU - Sun, Greg

PY - 2015/10/30

Y1 - 2015/10/30

KW - Germanium-tin

KW - Molecular beam epitaxy

KW - Raman spectroscopy

KW - Strain

KW - Transmission electron microscopy

KW - X-ray diffraction

UR - https://www.scopus.com/pages/publications/84945334376

UR - https://www.scopus.com/pages/publications/84945334376#tab=citedBy

U2 - 10.1016/j.tsf.2015.09.040

DO - 10.1016/j.tsf.2015.09.040

M3 - Article

AN - SCOPUS:84945334376

SN - 0040-6090

VL - 593

SP - 40

EP - 43

JO - Thin Solid Films

JF - Thin Solid Films

ER -

The strain dependence of Ge_{1 - x}sn_x (x = 0.083) Raman shift

ASJC Scopus Subject Areas

Keywords

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