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Validating MODIS land surface reflectance and albedo products: Methods and preliminary results

  • Shunlin Liang
  • , Hongliang Fang
  • , Mingzhen Chen
  • , Chad J. Shuey
  • , Charlie Walthall
  • , Craig Daughtry
  • , Jeff Morisette
  • , Crystal Schaaf
  • , Alan Strahler
  • University of Maryland, College Park
  • United States Department of Agriculture
  • NASA Goddard Space Flight Center
  • Boston University

Research output: Contribution to journal › Article › peer-review

Abstract

This paper presents the general methods and some preliminary results of validating Moderate-Resolution Imaging Spectroradiometer (MODIS) land surface reflectance and albedo products using ground measurements and Enhanced Thematic Mapper Plus (ETM+) imagery. Since ground "point" measurements are not suitable for direct comparisons with MODIS pixels of about 1 km over heterogeneous landscapes, upscaling based on high-resolution remotely sensed imagery is critical. In this study, ground measurements at Beltsville, MD were used to calibrate land surface reflectance and albedo products derived from ETM+ imagery at 30 m, which were then aggregated to the MODIS resolution for determining the accuracy of the following land surface products: (1) bidirectional reflectance from atmospheric correction, (2) bidirectional reflectance distribution function (BRDF), (3) broadband albedos, and (4) nadir BRDF-adjusted reflectance. The initial validation results from ground measurements and two ETM+ images acquired on October 2 and November 3, 2000 showed that these products are reasonably accurate, with typically less than 5% absolute error. Final conclusions on their accuracy depend on more validation results.

Original languageEnglish
Pages (from-to)149-162
Number of pages14
JournalRemote Sensing of Environment
Volume83
Issue number1-2
DOIs
StatePublished - Nov 2002

ASJC Scopus Subject Areas

  • Soil Science
  • Geology
  • Computers in Earth Sciences

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